Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes
- Rodríguez-Irago, M.
- Andina, J.J.R.
- Vargas, F.
- Semião, J.
- Teixeira, I.C.
- Teixeira, J.P.
Proceedings:
Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium
ISBN: 9780769526201
Year of publication: 2006
Volume: 2006
Pages: 257-262
Type: Conference paper