Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes

  1. Rodríguez-Irago, M.
  2. Andina, J.J.R.
  3. Vargas, F.
  4. Semião, J.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Actes de conférence:
Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium

ISBN: 9780769526201

Année de publication: 2006

Volumen: 2006

Pages: 257-262

Type: Communication dans un congrès

DOI: 10.1109/IOLTS.2006.25 GOOGLE SCHOLAR