A robust approach for comparison and validation of large signal measurement systems

  1. Williams, T.
  2. Mojón, O.
  3. Woodington, S.
  4. Lees, J.
  5. Barciela, M.F.
  6. Benedikt, J.
  7. Tasker, P.J.
Proceedings:
IEEE MTT-S International Microwave Symposium Digest

ISSN: 0149-645X

ISBN: 9781424417810

Year of publication: 2008

Pages: 257-260

Type: Conference paper

DOI: 10.1109/MWSYM.2008.4633152 GOOGLE SCHOLAR
Data source: Scopus