Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
- Semião, J.
- Freijedo, J.
- Andina, J.
- Vargas, F.
- Santos, M.
- Teixeira, I.
- Teixeira, P.
Konferenzberichte:
Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008
ISBN: 9780769532646
Datum der Publikation: 2008
Seiten: 227-232
Art: Konferenz-Beitrag