Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits

  1. Semião, J.
  2. Freijedo, J.
  3. Andina, J.
  4. Vargas, F.
  5. Santos, M.
  6. Teixeira, I.
  7. Teixeira, P.
Proceedings:
Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008

ISBN: 9780769532646

Year of publication: 2008

Pages: 227-232

Type: Conference paper

DOI: 10.1109/IOLTS.2008.51 GOOGLE SCHOLAR
Data source: Scopus