Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits

  1. Semião, J.
  2. Freijedo, J.
  3. Andina, J.
  4. Vargas, F.
  5. Santos, M.
  6. Teixeira, I.
  7. Teixeira, P.
Actes de conférence:
Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008

ISBN: 9780769532646

Année de publication: 2008

Pages: 227-232

Type: Communication dans un congrès

DOI: 10.1109/IOLTS.2008.51 GOOGLE SCHOLAR
La source de données: Scopus