PABLO
POU ALVAREZ
INVESTIGADORES "POSDOUTORAL XUNTA"
Academy of Sciences of the Czech Republic
Praga, República ChecaPublications en collaboration avec des chercheurs de Academy of Sciences of the Czech Republic (13)
2015
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Interplay between Switching Driven by the Tunneling Current and Atomic Force of a Bistable Four-Atom Si Quantum Dot
Nano Letters, Vol. 15, Núm. 7, pp. 4356-4363
2013
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Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity
Physical Review B - Condensed Matter and Materials Physics, Vol. 87, Núm. 15
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Quantum degeneracy in atomic point contacts revealed by chemical force and conductance
Physical Review Letters, Vol. 111, Núm. 10
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Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy
ACS Nano, Vol. 7, Núm. 8, pp. 7370-7376
2011
2009
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Structure and stability of semiconductor tip apexes for atomic force microscopy
Nanotechnology, Vol. 20, Núm. 26
2008
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Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Science, Vol. 322, Núm. 5900, pp. 413-417
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Tip-induced reduction of the resonant tunneling current on semiconductor surfaces
Physical Review Letters, Vol. 101, Núm. 17
2007
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Assembly of complex nano-structure from single atoms - Chemical identification, manipulation and assembly by AFM-
Shinku/Journal of the Vacuum Society of Japan, Vol. 50, Núm. 3, pp. 181-183
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Chemical identification of individual surface atoms by atomic force microscopy
Nature, Vol. 446, Núm. 7131, pp. 64-67
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Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Physical Review Letters, Vol. 98, Núm. 10
2006
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Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface
Physical Review B - Condensed Matter and Materials Physics, Vol. 73, Núm. 20
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Single atomic contact adhesion and dissipation in dynamic force microscopy
Physical Review Letters, Vol. 96, Núm. 10