Publicaciones en colaboración con investigadores/as de Universidade do Algarve (32)

2019

  1. Effect of carob variety and roasting on the antioxidant capacity, and the phenolic and furanic contents of carob liquors

    Journal of the Science of Food and Agriculture, Vol. 99, Núm. 6, pp. 2697-2707

2013

  1. Aging monitoring with local sensors in FPGA-based designs

    2013 23rd International Conference on Field Programmable Logic and Applications, FPL 2013 - Proceedings

  2. Design and validation of configurable online aging sensors in nanometer-scale FPGAs

    IEEE Transactions on Nanotechnology, Vol. 12, Núm. 4, pp. 508-517

2012

  1. Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits

    Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 28, Núm. 4, pp. 421-434

2011

  1. IP core to leverage RTOS-based embedded systems reliability to electromagnetic interference

    Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011

  2. Lower V DD operation of FPGA-based digital circuits through delay modeling and time borrowing

    Journal of Low Power Electronics, Vol. 7, Núm. 2, pp. 185-198

  3. Modeling the effect of process variations on the timing response of nanometer digital circuits

    LATW 2011 - 12th IEEE Latin-American Test Workshop

  4. Performance failure prediction using built-in delay sensors in FPGAs

    Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011

  5. Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects

    LATW 2011 - 12th IEEE Latin-American Test Workshop

2010

  1. Delay modeling for power noise-aware design in Spartan-3A FPGAS

    6th Southern Programmable Logic Conference, SPL 2010 - Proceedings

  2. Impact of power supply voltage variations on FPGA-based digital systems performance

    Journal of Low Power Electronics

  3. Investigating the use of BICS to detect resistive- open defects in SRAMs

    Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010

2008

  1. Delay modeling for power noise and temperature-aware design and test of digital systems

    Journal of Low Power Electronics, Vol. 4, Núm. 3, pp. 385-391