Rubén Pérez Pérez-rekin lankidetzan egindako argitalpenak (28)

2019

  1. Molecular Identification, Bond Order Discrimination, and Apparent Intermolecular Features in Atomic Force Microscopy Studied with a Charge Density Based Method

    ACS Nano, Vol. 13, Núm. 1, pp. 786-795

2018

  1. The electrostatic field of CO functionalized metal tips

    Springer Series in Surface Sciences (Springer Verlag), pp. 465-497

2017

  1. Atomic force microscopy contrast with CO functionalized tips in hydrogen-bonded molecular layers: Does the real tip charge distribution play a role?

    Physical Review B, Vol. 96, Núm. 7

2016

  1. Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy

    Physical Review Letters, Vol. 116, Núm. 24

  2. Graphene monovacancies: Electronic and mechanical properties from large scale ab initio simulations

    Carbon, Vol. 103, pp. 200-208

  3. The Electric Field of CO Tips and Its Relevance for Atomic Force Microscopy

    Nano Letters, Vol. 16, Núm. 3, pp. 1974-1980

2015

  1. Interplay between Switching Driven by the Tunneling Current and Atomic Force of a Bistable Four-Atom Si Quantum Dot

    Nano Letters, Vol. 15, Núm. 7, pp. 4356-4363

2014

  1. Sublattice localized electronic states in atomically resolved graphene-Pt(111) edge-boundaries

    ACS Nano, Vol. 8, Núm. 4, pp. 3590-3596

2013

  1. Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity

    Physical Review B - Condensed Matter and Materials Physics, Vol. 87, Núm. 15

  2. Quantum degeneracy in atomic point contacts revealed by chemical force and conductance

    Physical Review Letters, Vol. 111, Núm. 10

  3. Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy

    ACS Nano, Vol. 7, Núm. 8, pp. 7370-7376

2011

  1. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by aheterogeneous tip structure: A density functional theory study

    Nanotechnology, Vol. 22, Núm. 29

  2. Point defects on graphene on metals

    Physical Review Letters, Vol. 107, Núm. 11

2009

  1. Structure and stability of semiconductor tip apexes for atomic force microscopy

    Nanotechnology, Vol. 20, Núm. 26

2008

  1. Complex patterning by vertical interchange atom manipulation using atomic force microscopy

    Science, Vol. 322, Núm. 5900, pp. 413-417

  2. Describing bond-breaking processes by reactive potentials: Importance of an environment-dependent interaction range

    Physical Review B - Condensed Matter and Materials Physics, Vol. 78, Núm. 16

  3. Tip-induced reduction of the resonant tunneling current on semiconductor surfaces

    Physical Review Letters, Vol. 101, Núm. 17

2007

  1. Chemical identification of individual surface atoms by atomic force microscopy

    Nature, Vol. 446, Núm. 7131, pp. 64-67

  2. Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy

    Physical Review Letters, Vol. 98, Núm. 10

2006

  1. Local-orbital occupancy formulation of density functional theory: Application to Si, C, and graphene

    Physical Review B - Condensed Matter and Materials Physics, Vol. 73, Núm. 23