Publicacións en colaboración con investigadores/as de Academy of Sciences of the Czech Republic (15)

2024

  1. Performance of a Modular Ton-Scale Pixel-Readout Liquid Argon Time Projection Chamber

    Instruments, Vol. 8, Núm. 3

  2. The DUNE far detector vertical drift technology Technical design report

    Journal of Instrumentation, Vol. 19, Núm. 8

2015

  1. Interplay between Switching Driven by the Tunneling Current and Atomic Force of a Bistable Four-Atom Si Quantum Dot

    Nano Letters, Vol. 15, Núm. 7, pp. 4356-4363

2013

  1. Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity

    Physical Review B - Condensed Matter and Materials Physics, Vol. 87, Núm. 15

  2. Quantum degeneracy in atomic point contacts revealed by chemical force and conductance

    Physical Review Letters, Vol. 111, Núm. 10

  3. Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy

    ACS Nano, Vol. 7, Núm. 8, pp. 7370-7376

2011

  1. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by aheterogeneous tip structure: A density functional theory study

    Nanotechnology, Vol. 22, Núm. 29

2009

  1. Structure and stability of semiconductor tip apexes for atomic force microscopy

    Nanotechnology, Vol. 20, Núm. 26

2008

  1. Complex patterning by vertical interchange atom manipulation using atomic force microscopy

    Science, Vol. 322, Núm. 5900, pp. 413-417

  2. Tip-induced reduction of the resonant tunneling current on semiconductor surfaces

    Physical Review Letters, Vol. 101, Núm. 17

2007

  1. Assembly of complex nano-structure from single atoms - Chemical identification, manipulation and assembly by AFM-

    Shinku/Journal of the Vacuum Society of Japan, Vol. 50, Núm. 3, pp. 181-183

  2. Chemical identification of individual surface atoms by atomic force microscopy

    Nature, Vol. 446, Núm. 7131, pp. 64-67

  3. Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy

    Physical Review Letters, Vol. 98, Núm. 10

2006

  1. Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface

    Physical Review B - Condensed Matter and Materials Physics, Vol. 73, Núm. 20

  2. Single atomic contact adhesion and dissipation in dynamic force microscopy

    Physical Review Letters, Vol. 96, Núm. 10