A robust approach for comparison and validation of large signal measurement systems

  1. Williams, T.
  2. Mojón, O.
  3. Woodington, S.
  4. Lees, J.
  5. Barciela, M.F.
  6. Benedikt, J.
  7. Tasker, P.J.
Actas:
IEEE MTT-S International Microwave Symposium Digest

ISSN: 0149-645X

ISBN: 9781424417810

Ano de publicación: 2008

Páxinas: 257-260

Tipo: Achega congreso

DOI: 10.1109/MWSYM.2008.4633152 GOOGLE SCHOLAR