Complex patterning by vertical interchange atom manipulation using atomic force microscopy

  1. Sugimoto, Y.
  2. Pou, P.
  3. Custance, O.
  4. Jelinek, P.
  5. Abe, M.
  6. Perez, R.
  7. Morita, S.
Journal:
Science

ISSN: 0036-8075,  1095-9203

Year of publication: 2008

Volume: 322

Issue: 5900

Pages: 413-417

Type: Article

DOI: 10.1126/SCIENCE.1160601 GOOGLE SCHOLAR
Data source: Scopus