Complex patterning by vertical interchange atom manipulation using atomic force microscopy

  1. Sugimoto, Y.
  2. Pou, P.
  3. Custance, O.
  4. Jelinek, P.
  5. Abe, M.
  6. Perez, R.
  7. Morita, S.
Revue:
Science

ISSN: 0036-8075,  1095-9203

Année de publication: 2008

Volumen: 322

Número: 5900

Pages: 413-417

Type: Article

DOI: 10.1126/SCIENCE.1160601 GOOGLE SCHOLAR
La source de données: Scopus