Single atomic contact adhesion and dissipation in dynamic force microscopy

  1. Oyabu, N.
  2. Pou, P.
  3. Sugimoto, Y.
  4. Jelinek, P.
  5. Abe, M.
  6. Morita, S.
  7. Pérez, R.
  8. Custance, Ó.
Journal:
Physical Review Letters

ISSN: 1079-7114,  0031-9007

Year of publication: 2006

Volume: 96

Issue: 10

Type: Article

DOI: 10.1103/PHYSREVLETT.96.106101 GOOGLE SCHOLAR
Data source: Scopus