Single atomic contact adhesion and dissipation in dynamic force microscopy

  1. Oyabu, N.
  2. Pou, P.
  3. Sugimoto, Y.
  4. Jelinek, P.
  5. Abe, M.
  6. Morita, S.
  7. Pérez, R.
  8. Custance, Ó.
Revue:
Physical Review Letters

ISSN: 1079-7114,  0031-9007

Année de publication: 2006

Volumen: 96

Número: 10

Type: Article

DOI: 10.1103/PHYSREVLETT.96.106101 GOOGLE SCHOLAR
La source de données: Scopus