Single atomic contact adhesion and dissipation in dynamic force microscopy
- Oyabu, N.
- Pou, P.
- Sugimoto, Y.
- Jelinek, P.
- Abe, M.
- Morita, S.
- Pérez, R.
- Custance, Ó.
ISSN: 1079-7114, 0031-9007
Argitalpen urtea: 2006
Alea: 96
Zenbakia: 10
Mota: Artikulua