ArF excimer laser epitaxy of Si x Ge 1-x alloys studied by XRD and XPS
- Larciprete, R.
- Willmott, P.
- Martelli, S.
- Cesile, M.C.
- Borsella, E.
- Chiussi, S.
- González, P.
- León, B.
Aldizkaria:
Applied Surface Science
ISSN: 0169-4332
Argitalpen urtea: 1996
Alea: 106
Orrialdeak: 179-185
Mota: Artikulua